JEOL-2010 High Resolution Transmission Electron Microscope

The JEOL-2010 TEM is a transmission electron microscope that can perform high resolution lattice imaging for solid materials and thin films. The instrument can typically be used to image metals, ceramics, minerals, nanostructured natural or synthetic materials, and biological-related materials and tissues at atomic-bond-length resolution. Researchers can use this instrument for work related to spintronics, environmental issues, geophysics and geochemical research, atmospheric research, biological research, catalysis, among a variety of applications. 

This instrument provides analytical 200 kV TEM capability for detecting elements ranging from carbon to thorium.  It is capable of a wide range of illumination lens conditions: TEM mode for Bright Field (BF) and Dark Field (DF) imaging and phase contrast imaging; Atomic arrangements are determined by electron diffraction in Selected Area, CBED (convergent beam), and nano-diffraction modes.

• LaB6 electron gun and can be operated between 80 and 200kV
• Point-to-point resolutions of 0.19 nm, with magnification up to 1500,000x
• Specimen holders: single tilt and double tilt
• Digital imaging with AMT Advantage HRB, 1 M pixel, cooled, research grade CCD Camera System.

Our sample preparation equipments for plane view and cross-section view of geological, and semiconductor materials include an ultrasonic disk cutter (Mode 170), a dimpling Grinder with auto terminator, microscope attachment (Model 200), and an ion milling system controlled by PC capable of double sided variable milling angle with liquid nitrogen specimen cooling, and microscope (Model 1010). Additional equipments are specimen grinder, X-section kits and Buehler grinder and low speed saw.

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