Philips X’Pert-MPD X-ray Diffraction System

5131 Ingersoll Hall
P: 718.951.5000, ext. 1228

This multipurpose X-ray diffractometer is a Philips X'Pert MPD system with a vertical T-T goniometer (190 mm radius). The X-ray source is a long-fine-focus, ceramic X-ray tube with Cu anode. Normal operating power is 40 kV, 50 mA (2.0 kW). The system optics consist of programmable divergence, anti-scatter, and receiving slits; incident and diffracted beam soller slits; a curved graphite diffracted beam monochromator; and a proportional counter detector (Bragg-Brentano parafocusing geometry).

The principal application of this system is phase analysis of powder and thin film samples. The Multi-Purpose Sample Stage supports typical cavity-type powder mounts and will also accommodate monolithic specimens of a wide variety of sizes and shapes. Currently it has been used for identification and quantification of minerals (e.g., asbestos) and metal oxides in geological and synthetic specimen, and rocking curve measurements.